PA is a non-destructive method, suitable to analyze the elemental composition of powdered samples.
Recommendation
- 7 – 10 g of a dry powdered sample of < 250 μm size fraction is preferred. If samples are delivered wet and bulky, additional preparation steps (drying, grinding, or sieving) prolong the analysis, and an extra charge is applied (see the XRF Sample Preparation rate on the Pricing, Billing, and Payment page).
- The average turnaround time is two weeks per 10 samples.
Methodology
The sample is dried at 105 °C overnight and sieved to < 250 μm. 4 g of the sample is weighed and placed into a Chemplex Industries, Inc. TrimLess® Sleeved sample cup (Cat # 1330) fitted with a Chemplex Industries, Inc. Prolene® film (Cat # 426). Samples cups are analyzed by a Rigaku NEX CG Energy-Dispersive X-Ray Fluorescence (EDXRF) spectrometer equipped with an automatic sample changer that accommodates 13 specimens and 2 standards under ultra-high purity helium atmosphere.
Results
Semi-quantitative analyses are obtained using Rigaku’s RPF-SQX (Rigaku Profile Fitting-Spectra Quant X) software combine with the FP (fundamental parameters) method. The LLD or LOD are determined by the software. The final report includes the content of Na, Mg, Al, Si, P, S, K, Ca, Ti, Mn, and Fe oxides in wt. percentages, and concentration of other elements in ppm.
Quality Assurance (QA) and Quality Control (QC)
Precision and accuracy are determined by analyzing sample duplicates as well as certified reference materials from the National Institute of Standards & Technology (NIST).